Browsing by Author "Ahmad, Syed Sajid"
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Characterizing the Aging-Driven Degradation Rate of Electrical Contact Resistance and Mechanical Integrity of Plastic-Encapsulated Au/Al Wire Bonds
Ahmad, Syed Sajid (North Dakota State University, 2019)Gold-aluminum interconnect is an integral part of conventional chip packaging. The gold-aluminum interface deteriorates during the operation of a device due to the formation of gold-aluminum intermetallic compounds. Spatial ...