Single-Wall Carbon Nanotube Thin Films: Processing Measurement and Methodology

dc.contributor.authorWaters, Alex John Brown
dc.date.accessioned2018-04-16T18:57:17Z
dc.date.available2018-04-16T18:57:17Z
dc.date.issued2016en_US
dc.description.abstractAs society advances to desire smaller, faster, and cheaper electronics along with stronger materials, the search for novel materials continues. Thin films made from single wall carbon nanotubes (SWCNTs) offer a possible solution to many of the challenges that materials scientists currently face. Here, a methodology for studying the deformation of thin SWCNT films is investigated during their processing for use in applications such as photovoltaic devices. A variety of methods for manipulating and visualizing these thin films are discussed, along with the setbacks encountered along the path to improving process characterization.en_US
dc.identifier.urihttps://hdl.handle.net/10365/27969
dc.publisherNorth Dakota State Universityen_US
dc.rightsNDSU Policy 190.6.2
dc.rights.urihttps://www.ndsu.edu/fileadmin/policy/190.pdf
dc.titleSingle-Wall Carbon Nanotube Thin Films: Processing Measurement and Methodologyen_US
dc.typeThesisen_US
ndsu.advisorHobbie, Erik K.
ndsu.collegeScience and Mathematicsen_US
ndsu.degreeMaster of Science (MS)en_US
ndsu.departmentPhysicsen_US
ndsu.programPhysicsen_US

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