Resistance Screening and QTL Mapping in Wheat and Triticale Against Root-Lesion Nematode

Abstract

Root-lesion nematode (RLN, Pratylenchus neglectus) invades the roots of wheat and causes yield losses throughout the world. Genetic resistance is the most economical and effective means to manage RLNs. The objective of this study were to identify source of resistance to RLN in a small collection of wheat germplasm and to map quantitative trait loci (QTL) associated with RLN resistance in two; one wheat and one triticale recombinant inbred line (RIL) populations. Out of wheat lines, three were resistant, including hard red spring wheat cultivars Brennan, SY Ingmar, and SY Soren. A number of genomic regions in wheat and rye were identified as QTL for RLN resistance. My research provides a better understanding of the genetic basis of P. neglectus resistance and important tools for RLN resistance breeding.