2009-05-292009-05-291982https://hdl.handle.net/10365/4708The article describes three conditions that reduce corn yields: corn head smut, common smut and common maize rust. The article shifts to it's discussion of adapted inbred lines that were evaluated for resistance to head smut, common smut and common rust. Eight released lines: ND11RF, ND300, ND376, ND405, ND408, ND478, CM105 and CM174. These were absent of head smut. ND300, ND376, ND408, ND468, CM105 and CM174 were resistant to both smuts.North Dakota State UniversityCornPlant diseases and disordersArticle