Browsing Plant Pathology Masters Theses by Author "Kariyawasam, Gayan Kanishka"
Now showing items 1-1 of 1
-
Genetic Mapping of Quantitative Trait Loci for Resistance to Wheat Tan Spot Using Two Bi-Parental Populations
Kariyawasam, Gayan Kanishka (North Dakota State University, 2015)Tan spot, caused by Pyrenophora tritici-repentis (Ptr), is an economically important disease on both common wheat (Triticum aestivum L.) and durum (T. turgidum L. ssp. durum). Genetics of resistance to tan spot is complicated ...