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dc.contributor.authorManley, Aurora Alexandra
dc.description.abstractTan spot and Septoria nodorum blotch cause serious yield losses in winter wheat in North Dakota as the majority of commercially grown cultivars are susceptible. This study aimed to identify lines with improved resistance for use as breeding parents. First, advanced NDSU breeding lines and alternative sources of resistance were inoculated with fungal isolates and tested for necrotrophic effector sensitivity. Second, resistant lines were derived from a highly heterogeneous recurrent mass selection F2 population using single seed descent inbreeding coupled with selection for resistance. Finally, the best performers from both experiments (total of 52 lines) were evaluated to confirm resistance. In addition the 52 lines were analyzed with markers that detect Tsn1 and the 1RS rye translocation. Twenty lines were identified with simultaneous resistance to four or three fungal isolates and insensitivity to three, two, or one necrotrophic effectors (of which 11 can be used directly as new parents).en_US
dc.publisherNorth Dakota State Universityen_US
dc.rightsNDSU policy 190.6.2
dc.titleSelection of Hard Red Winter Wheat Lines with Diverse Resistance to Leaf Spot Diseasesen_US
dc.typeThesisen_US
dc.date.accessioned2018-04-24T18:23:46Z
dc.date.available2018-04-24T18:23:46Z
dc.date.issued2016
dc.identifier.urihttps://hdl.handle.net/10365/28025
dc.subject.lcshBotany.en_US
dc.description.sponsorshipNorth Dakota Wheat Commissionen_US
dc.description.sponsorshipMinnesota Wheat Research Promotion Councilen_US
dc.rights.urihttps://www.ndsu.edu/fileadmin/policy/190.pdf
ndsu.degreeMaster of Science (MS)en_US
ndsu.collegeAgriculture, Food Systems and Natural Resourcesen_US
ndsu.departmentPlant Sciencesen_US
ndsu.programPlant Sciencesen_US
ndsu.advisorMarais, Francois


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