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dc.contributor.authorLiu, Yuan
dc.description.abstractTan spot, caused by the necrotrophic fungal pathogen Pyrenophora tritici-repentis (Ptr), is a major foliar disease in wheat. QTL mapping and meta-QTL analysis are effective methods to understand genetic basis of tan spot resistance, which can further facilitate resistant variety development. A number of QTL mapping studies have been conducted in hexaploid bread wheat whereas few mapping studies have been carried out in tetraploid wheat. Four interconnected tetraploid wheat mapping populations were evaluated for resistance to race 2 isolate 86-124. Twelve QTL were identified in three of the four mapping populations. To further extend understanding of tan spot resistance, meta-QTL analysis was conducted by using reported QTL from 14 previous QTL mapping studies. Three meta-QTL located on chromosomes 2A, 3B, and 5A showed large genetic effects in multiple populations and conferred resistance to multiple races. Integrating those race-nonspecific QTL could provide high and stable tan spot resistance in wheat.en_US
dc.publisherNorth Dakota State Universityen_US
dc.rightsNDSU policy 190.6.2en_US
dc.titleGenetic Dissection of Tan Spot Resistance in Wheaten_US
dc.typeThesisen_US
dc.date.accessioned2021-05-11T19:16:31Z
dc.date.available2021-05-11T19:16:31Z
dc.date.issued2020
dc.identifier.urihttps://hdl.handle.net/10365/31853
dc.subjectgenetic mappingen_US
dc.subjecttan spoten_US
dc.subjectwheaten_US
dc.rights.urihttps://www.ndsu.edu/fileadmin/policy/190.pdfen_US
ndsu.degreeMaster of Science (MS)en_US
ndsu.collegeAgriculture, Food Systems and Natural Resourcesen_US
ndsu.departmentPlant Sciencesen_US
ndsu.advisorLi, Xuehui


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